28–30 Sept 2020
America/Detroit timezone

Conceptual Design of an Electrostatic Trap for High Intensity Pulsed Beam

30 Sept 2020, 10:05
10m
Poster

Speaker

Wei Huang (Institute of Modern Physics)

Description

Highly charged ion sources play an important role in
the advancement of heavy ion accelerators
worldwide. The beam requirements of highly charged
heavy ions from new accelerators have driven the
performance of ion sources to their limits and
beyond. In parallel to developing new technologies to
enhance the performance of ECR ion source, this
paper presents a conceptual design of an ion trap
aiming to convert a cw ion beam into a short beam
pulse with high compression ratios. With an electron
gun, a solenoid and a set of drift tubes, the injected
ions will be trapped radially and axially. By
manipulating the potential of drift tubes, ions can be
accumulated with multiple injections and extracted at
a fast or slow scheme. This paper presents the
simulation and design results of this ion trap
prototype.

Authors

Wei Huang (Institute of Modern Physics) Hongwei Zhao Liangting Sun (Institute of Modern Physics, CAS) Daniel Xie (LBNL, Berkeley, California)

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