1–2 Oct 2020
Virtual via Zoom
America/Detroit timezone

Conceptual Design of an Electrostatic Trap for High Intensity Pulsed Beam

2 Oct 2020, 09:15
30m
Virtual via Zoom

Virtual via Zoom

Speaker

Wei Huang (Institute of Modern Physics)

Description

Highly charged ion sources play an important role in the advancement of heavy ion accelerators worldwide. The beam requirements of highly charged heavy ions from new accelerators have driven the performance of ion sources to their limits and beyond. In parallel to developing new technologies to enhance the performance of ECR ion source, this paper presents a conceptual design of an ion trap aiming to convert a cw ion beam into a short beam pulse with high compression ratios. With an electron gun, a solenoid and a set of drift tubes, the injected ions will be trapped radially and axially. By manipulating the potential of drift tubes, ions can be accumulated with multiple injections and extracted at a fast or slow mode. This paper presents the simulation and the design of this ion trap prototype.

Authors

Wei Huang (Institute of Modern Physics) Dr Daniel Zuqi xie (Lawrence Berkeley National Lab) Dr Liang Ting Sun (Institute of Modern Physics) Dr Hong Wei Zhao (Institute of Modern Physics)

Presentation materials